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High Stability AFM Microscope 0.1 Hz - 30 Hz AFM Systems For Materials Biology And Electronics Imaging
High Stability AFM For Materials Biology And Electronics Imaging Product Description: The Atomic Force Microscope is a cutting-edge scientific instrument that offers high-resolution imaging and precise measurements for a wide range of applications in nanotechnology, material science, and biological research. This advanced microscope utilizes XYZ Three-axis Full Sample Scanning method, allowing for detailed analysis of samples with exceptional accuracy. One of the key features
Nanoscale Potential Atomic Force Microscopy Adjustable Industrial Microscopes High Resolution
Nanoscale Potential With Atomic Force Microscope For High-Resolution Imaging Product Description: One of the key features of the AFM is its impressive scanning range, measuring at 100 μm X 100 μm X 10 μm. This wide range allows for detailed imaging and analysis of a variety of samples, from small nanoparticles to larger structures. With a scan speed ranging from 0.1Hz to 30Hz, the AFM offers versatility in capturing dynamic processes and obtaining quick results. Researchers
Precise Control Vibrating Magnetometer 77 K - 950 K Temperature Range VSM For Powders Films
Vibrating Sample Magnetometer For Powders Films And Bulk Samples Product Description: A Vibrating Sample Magnetometer (VSM) is an essential tool for researchers and scientists working in the field of magnetic materials and properties. This particular VSM product offers a comprehensive set of features and capabilities that make it a top choice for those in need of a reliable and precise magnetic property measurement system. One of the key highlights of this VSM is its
Low Noise Vibrating Sample Magnetometer High Speed VSM Versatile For Reliable Magnetic Characterization
High Speed VSM For Fast And Reliable Magnetic Characterization Product Description: The Vibrating Sample Magnetometer (VSM) is a powerful tool designed to meet the needs of researchers working with materials such as Multiferroics and Spintronics. This advanced instrument offers precise measurements and reliable performance, making it an essential asset for any laboratory focusing on magnetic materials. One of the key features of the VSM is its low noise level, which is
Customizable AFM System Scientific Industrial Materials Microscopes With Strong Scalability
Customizable AFM System with Strong Scalability for Your Research Product Description: The Atomic Force Microscope is a cutting-edge tool designed for high-precision imaging and analysis in various scientific and industrial applications. With its advanced technology and superior performance, this instrument offers unparalleled capabilities for researchers and engineers working in fields such as nanotechnology, materials science, and semiconductor research. One of the key
50 MT Magnetic Probe Station RH Testing Wafer Probe Stations For Magnetic Film Measurement
Cost Effective Wafer Probe Station For Magnetic Film Measurement Product Description: Introducing the Wafer-Level Manual In-Plane Magnetic Field Probe Station, a cutting-edge solution for wafer-level electrical measurement with a focus on RH Testing. This innovative probe station is designed to provide precise testing functions for in-plane magnetic fields with a magnetic field resolution of PID Closed-loop Feedback Regulation and an impressive resolution of 0.05 MT. One of
Versatile MRAM Tester High Resolution ATE Test Equipment For Electrical Chip Properties
ATE For Non Destructive Magnetic And Electrical Chip Properties Product Description: One of the key highlights of this product is its Excitation System2, which ensures the uniformity of the X-axis magnetic field with an impressive accuracy of ≤±1% at 2000 Oe within a Φ35 mm spherical space. This level of precision guarantees consistent and reliable test results, particularly when analyzing in-plane magnetic fields. Moreover, the Excitation System4 of the machine boasts a
4K Closed Loop Semiconductor Probe Station Vacuum Wafer Probe Station For 2 Inch Wafer Testing
4K Closed Loop Cryogenic Probe Station For 2 Inch Wafer Testing Product Description: The Cryogenic Probe Station is an essential tool for researchers and scientists working in the field of low-temperature measurements. This advanced equipment is designed to provide precise control over the thermal environment during experiments, ensuring accurate and reliable results. With its innovative features and high-performance capabilities, the Cryogenic Probe Station is ideal for a
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Recently, the research team from the Center for Spintronics and Quantum Systems at the School of Materials Science and Engineering, Xi'an Jiaotong...
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Recently, the research team from the Research Institute of Clean Energy and Fuel Chemistry, School of Chemical Engineering at the University of...
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